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SFX: Skin Microstructure Deformation with Convolution

June 23, 2015
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ICT Graphics Lab present a technique for synthesizing the effects of skin microstructure deformation by anisotropically convolving a high resolution displacement map to match normal distribution changes in measured skin samples. We use a 10-micron resolution scanning technique to measure several in vivo skin samples as they are stretched and compressed in different directions, quantifying how stretching smooths the skin and compression makes it rougher.

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